Focussed Ion-Beam Section Electron Microscope images (fibsem) and Serial Section Transmission Electron Microscope images (sstem) offers details at sub-cellular level of dynamic processes frozen in time. Neurons are of particular interests to us, since they independently are simple but collectively have complex behavior. One process of interest is neuronal communication, and for some time we have studied first and second order statistics of vesicles near the synaptic cleft. As Data Scientists we use such cases as inspiration for development of new methods, and at the same time we contribute with new insights into the application area. For example, by identifying parameters that are insensitive to shape and size of synaptic regions, we see clear differences in both the overall distribution and clustering behavior of vesicles in animal models of stress. Such observations lead us to propose new models of hidden parameters with the hope of being able to see the unseen. We are also extending our approach to other ultrastructures: mitochondria, endosome, endoplasmatic reticulum and other tubular structures. Our goal is to develop models of the dynamic behavior of geometric objects in the synaptic area by analyzing the statistical of all structures visible in fibsem images near synapses.

主讲人简介：

Jon Sporring received his Master and Ph.D. degree from the Department of Computer Science, University of Copenhagen, Denmark in 1995 and 1998, respectively. Part of his Ph.D. program was carried out at IBM Research Center, Almaden, California, USA. Following his Ph.D, he worked as a visiting researcher at the Computer Vision and Robotics Lab at Foundation for Research & Technology - Hellas, Greece, and as assistant research professor at 3D-Lab, School of Dentistry, University of Copenhagen. Since 2003 he has been employed as associate professor at the Department of Computer Science, University of Copenhagen. From 2008-2009 he was part-time Senior Researche