由信息与通信工程学院主办的“信通论坛”本次邀请到英国皇家工程院院士,南安普顿大学Lajos Hanzo教授来校进行学术交流，具体安排如下，欢迎感兴趣的师生参加。

一、主　题：Joint Sensing, Social Networking and Computing: From Single-to Multi-component Pareto-Optimization

二、主讲人：Lajos Hanz（南安普顿大学，教授）

三、时　间：2021年12月28日（周二）16:30-17:30

四、参加方式：

线上平台：ZOOM Meeting

会议链接：https://essex-university.zoom.us/j/94951085087

会议I    D：949 5108 5087

五、内容简介：

Thanks to the spectacular advances in signal processing and nano-technology, five wireless generations have been conceived over the past five decades. Whilst the 5G systems are being rolled out, the momentum of developing the 6G systems is growing and there is an ongoing debate as to what the next ’killer-application’ is likely to be - could it be joint sensing, communications and computing?

 • Joint Radar and Communication Design: Applications, State-of-the-Art, and the Road Ahead” IEEE TCOM, by Fan Liu, Christos Masouros, Athina P. Petropulu, Hugh Griffiths & Lajos Hanzo

 • Social Networking and Caching Aided Collaborative Computing for the Internet of Things by Yutong Ai, Li Wang, Zhu Han, Ping Zhang & Lajos Hanzo,

 • Bridging the Social and Wireless Networking Divide: Information Dissemination in Integrated Cellular and Opportunistic Networks by Jie Hu, Lie-Liang Yang, Vincent Poor & Lajos Hanzo IEEE Access, 2015

 • Beamforming Design Based on Two-Stage Stochastic Optimization for RIS-Assisted Over-the-Air Computation Systems Xiongfei Zhai, Guojun Han, Yunlong Cai & Lajos Hanzo IEEE IoT Journal

 This overview will highlight some of the associated design options and challenges, complemented by potential application scenarios.

七、主讲人简介

Lajos Hanzo is a Fellow of the Royal Academy of Engineering (FREng), FIEEE, FIET and a EURASIP Fellow, Foreign Member of the Hungarian Academy of Science. He holds honorary Doctorates from the University of Edinburgh and the Technical University of Budapest. He co-authored 19 IEEE Press - John Wiley books and 1970 research contributions at IEEE Xplore. For further information on his research in progress and associated publications please refer to IEEE Xplore.